Analysis of Sample Correlations for Monte Carlo Rendering
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Date
2019Author
Singh, Gurprit
Öztireli, Cengiz
Subr, Kartic
Deussen, Oliver
Ostromoukhov, Victor
Ramamoorthi, Ravi
Jarosz, Wojciech
Metadata
Show full item recordAbstract
Modern physically based rendering techniques critically depend on approximating integrals of high dimensional functions representing radiant light energy. Monte Carlo based integrators are the choice for complex scenes and effects. These integrators work by sampling the integrand at sample point locations. The distribution of these sample points determines convergence rates and noise in the final renderings. The characteristics of such distributions can be uniquely represented in terms of correlations of sampling point locations. Hence, it is essential to study these correlations to understand and adapt sample distributions for low error in integral approximation. In this work, we aim at providing a comprehensive and accessible overview of the techniques developed over the last decades to analyze such correlations, relate them to error in integrators, and understand when and how to use existing sampling algorithms for effective rendering workflows.
BibTeX
@article {10.1111:cgf.13653,
journal = {Computer Graphics Forum},
title = {{Analysis of Sample Correlations for Monte Carlo Rendering}},
author = {Singh, Gurprit and Öztireli, Cengiz and Ahmed, Abdalla G. M. and Coeurjolly, David and Subr, Kartic and Deussen, Oliver and Ostromoukhov, Victor and Ramamoorthi, Ravi and Jarosz, Wojciech},
year = {2019},
publisher = {The Eurographics Association and John Wiley & Sons Ltd.},
ISSN = {1467-8659},
DOI = {10.1111/cgf.13653}
}
journal = {Computer Graphics Forum},
title = {{Analysis of Sample Correlations for Monte Carlo Rendering}},
author = {Singh, Gurprit and Öztireli, Cengiz and Ahmed, Abdalla G. M. and Coeurjolly, David and Subr, Kartic and Deussen, Oliver and Ostromoukhov, Victor and Ramamoorthi, Ravi and Jarosz, Wojciech},
year = {2019},
publisher = {The Eurographics Association and John Wiley & Sons Ltd.},
ISSN = {1467-8659},
DOI = {10.1111/cgf.13653}
}