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dc.contributor.authorTewari, Geetikaen_US
dc.contributor.authorSnyder, Johnen_US
dc.contributor.authorSander, Pedro V.en_US
dc.contributor.authorGortler, Steven J.en_US
dc.contributor.authorHoppe, Huguesen_US
dc.contributor.editorRoberto Scopigno and Denis Zorinen_US
dc.date.accessioned2014-01-29T09:19:48Z
dc.date.available2014-01-29T09:19:48Z
dc.date.issued2004en_US
dc.identifier.isbn3-905673-13-4en_US
dc.identifier.issn1727-8384en_US
dc.identifier.urihttp://dx.doi.org/10.2312/SGP/SGP04/057-066en_US
dc.description.abstractWe propose a metric for surface parameterization specialized to its signal that can be used to create more efficient, high-quality texture maps. Derived from Taylor expansion of signal error, our metric predicts the signal approximation error - the difference between the original surface signal and its reconstruction from the sampled texture. Unlike previous methods, our metric assumes piecewise-linear reconstruction, and thus makes a good approximation to bilinear reconstruction employed in graphics hardware. We achieve significant savings in texture area for a desired signal accuracy compared to the signal-specialized parameterization metric proposed by Sander et al. in the 2002 Eurographics Workshop on Rendering.en_US
dc.publisherThe Eurographics Associationen_US
dc.subjectCategories and Subject Descriptors (according to ACM CCS): I.3.7 [Computer Graphics]: Color, shading, shadowing and textureen_US
dc.titleSignal-Specialized Parameterization for Piecewise Linear Reconstructionen_US
dc.description.seriesinformationSymposium on Geometry Processingen_US


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