dc.contributor.author | Tewari, Geetika | en_US |
dc.contributor.author | Snyder, John | en_US |
dc.contributor.author | Sander, Pedro V. | en_US |
dc.contributor.author | Gortler, Steven J. | en_US |
dc.contributor.author | Hoppe, Hugues | en_US |
dc.contributor.editor | Roberto Scopigno and Denis Zorin | en_US |
dc.date.accessioned | 2014-01-29T09:19:48Z | |
dc.date.available | 2014-01-29T09:19:48Z | |
dc.date.issued | 2004 | en_US |
dc.identifier.isbn | 3-905673-13-4 | en_US |
dc.identifier.issn | 1727-8384 | en_US |
dc.identifier.uri | http://dx.doi.org/10.2312/SGP/SGP04/057-066 | en_US |
dc.description.abstract | We propose a metric for surface parameterization specialized to its signal that can be used to create more efficient, high-quality texture maps. Derived from Taylor expansion of signal error, our metric predicts the signal approximation error - the difference between the original surface signal and its reconstruction from the sampled texture. Unlike previous methods, our metric assumes piecewise-linear reconstruction, and thus makes a good approximation to bilinear reconstruction employed in graphics hardware. We achieve significant savings in texture area for a desired signal accuracy compared to the signal-specialized parameterization metric proposed by Sander et al. in the 2002 Eurographics Workshop on Rendering. | en_US |
dc.publisher | The Eurographics Association | en_US |
dc.subject | Categories and Subject Descriptors (according to ACM CCS): I.3.7 [Computer Graphics]: Color, shading, shadowing and texture | en_US |
dc.title | Signal-Specialized Parameterization for Piecewise Linear Reconstruction | en_US |
dc.description.seriesinformation | Symposium on Geometry Processing | en_US |