Signal-Specialized Parameterization for Piecewise Linear Reconstruction
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Date
2004Author
Tewari, Geetika
Snyder, John
Sander, Pedro V.
Gortler, Steven J.
Hoppe, Hugues
Metadata
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We propose a metric for surface parameterization specialized to its signal that can be used to create more efficient, high-quality texture maps. Derived from Taylor expansion of signal error, our metric predicts the signal approximation error - the difference between the original surface signal and its reconstruction from the sampled texture. Unlike previous methods, our metric assumes piecewise-linear reconstruction, and thus makes a good approximation to bilinear reconstruction employed in graphics hardware. We achieve significant savings in texture area for a desired signal accuracy compared to the signal-specialized parameterization metric proposed by Sander et al. in the 2002 Eurographics Workshop on Rendering.
BibTeX
@inproceedings {10.2312:SGP:SGP04:057-066,
booktitle = {Symposium on Geometry Processing},
editor = {Roberto Scopigno and Denis Zorin},
title = {{Signal-Specialized Parameterization for Piecewise Linear Reconstruction}},
author = {Tewari, Geetika and Snyder, John and Sander, Pedro V. and Gortler, Steven J. and Hoppe, Hugues},
year = {2004},
publisher = {The Eurographics Association},
ISSN = {1727-8384},
ISBN = {3-905673-13-4},
DOI = {10.2312/SGP/SGP04/057-066}
}
booktitle = {Symposium on Geometry Processing},
editor = {Roberto Scopigno and Denis Zorin},
title = {{Signal-Specialized Parameterization for Piecewise Linear Reconstruction}},
author = {Tewari, Geetika and Snyder, John and Sander, Pedro V. and Gortler, Steven J. and Hoppe, Hugues},
year = {2004},
publisher = {The Eurographics Association},
ISSN = {1727-8384},
ISBN = {3-905673-13-4},
DOI = {10.2312/SGP/SGP04/057-066}
}