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dc.contributor.authorZhou, Hongen_US
dc.contributor.authorCui, Weiweien_US
dc.contributor.authorQu, Huaminen_US
dc.contributor.authorWu, Yingcaien_US
dc.contributor.authorYuan, Xiaoruen_US
dc.contributor.authorZhuo, Weien_US
dc.contributor.editorH.-C. Hege, I. Hotz, and T. Munzneren_US
dc.date.accessioned2014-02-21T19:50:27Z
dc.date.available2014-02-21T19:50:27Z
dc.date.issued2009en_US
dc.identifier.issn1467-8659en_US
dc.identifier.urihttp://dx.doi.org/10.1111/j.1467-8659.2009.01476.xen_US
dc.description.abstractcoordinates. Our framework consists of two major components: a polyline splatter for cluster detection and a segment splatter for clutter reduction. The cluster detection is performed by splatting the lines one by one into the parallel coordinates plots, and for each splatted line we enhance its neighboring lines and suppress irrelevant ones. To reduce visual clutter caused by line crossings and overlappings in the clustered results, we provide a segment splatter which represents each polyline by one segment and splats these segments with different speeds, colors, and lengths from the leftmost axis to the rightmost axis. Users can interactively control both the polyline splatting and the segment splatting processes to emphasize the features they are interested in. The experimental results demonstrate that our framework can effectively reveal some hidden patterns in parallel coordinates.en_US
dc.publisherThe Eurographics Association and Blackwell Publishing Ltd.en_US
dc.titleSplatting the Lines in Parallel Coordinatesen_US
dc.description.seriesinformationComputer Graphics Forumen_US
dc.description.volume28en_US
dc.description.number3en_US


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