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dc.contributor.authorBoissonnat, J. D.en_US
dc.contributor.authorOudot, S.en_US
dc.contributor.editorGershon Elber and Nicholas Patrikalakis and Pere Bruneten_US
dc.date.accessioned2016-02-17T18:02:45Z
dc.date.available2016-02-17T18:02:45Z
dc.date.issued2004en_US
dc.identifier.isbn3-905673-55-Xen_US
dc.identifier.issn1811-7783en_US
dc.identifier.urihttp://dx.doi.org/10.2312/sm.20041381en_US
dc.description.abstractThe notion of e-sample, as introduced by Amenta and Bern, has proven to be a key concept in the theory of sampled surfaces. Of particular interest is the fact that, if E is an e-sample of a smooth surface S for a suf ciently small e, then the Delaunay triangulation of E restricted to S is a good approximation of S, both in a topological and in a geometric sense. Hence, if one can construct an e-sample, one also gets a good approximation of the surface. Moreover, correct reconstruction is ensured by various algorithms. In this paper, we introduce the notion of loose e-sample. We show that the set of loose e-samples contains and is asymptotically identical to the set of e-samples. The main advantage of loose e-samples over e-samples is that they are easier to check and to construct. We also present a simple algorithm that constructs provably good surface samples and meshes.en_US
dc.publisherThe Eurographics Associationen_US
dc.subjectI.3.5 [Computer Graphics]en_US
dc.subjectCurveen_US
dc.subjectsurfaceen_US
dc.subjectsoliden_US
dc.subjectand object representationsen_US
dc.titleAn Effective Condition for Sampling Surfaces with Guaranteesen_US
dc.description.seriesinformationSolid Modelingen_US
dc.description.sectionheadersSurface Parametrization and Approximationen_US
dc.identifier.doi10.2312/sm.20041381en_US
dc.identifier.pages101-112en_US


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