Efficient Raytracing of Deforming Point-Sampled Surfaces
dc.contributor.author | Adams, Bart | en_US |
dc.contributor.author | Keiser, Richard | en_US |
dc.contributor.author | Pauly, Mark | en_US |
dc.contributor.author | J. Guibas, Leonidas | en_US |
dc.contributor.author | Gross, Markus | en_US |
dc.contributor.author | Dutre, Philip | en_US |
dc.date.accessioned | 2015-02-20T10:04:14Z | |
dc.date.available | 2015-02-20T10:04:14Z | |
dc.date.issued | 2005 | en_US |
dc.identifier.issn | 1467-8659 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1111/j.1467-8659.2005.00892.x | en_US |
dc.publisher | The Eurographics Association and Blackwell Publishing, Inc | en_US |
dc.title | Efficient Raytracing of Deforming Point-Sampled Surfaces | en_US |
dc.description.seriesinformation | Computer Graphics Forum | en_US |
dc.description.volume | 24 | en_US |
dc.description.number | 3 | en_US |
dc.identifier.doi | 10.1111/j.1467-8659.2005.00892.x | en_US |
dc.identifier.pages | 677-684 | en_US |
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