Show simple item record

dc.contributor.authorJendersie, Johannesen_US
dc.contributor.authorGrosch, Thorstenen_US
dc.contributor.editorBoubekeur, Tamy and Sen, Pradeepen_US
dc.date.accessioned2019-07-14T19:24:10Z
dc.date.available2019-07-14T19:24:10Z
dc.date.issued2019
dc.identifier.issn1467-8659
dc.identifier.urihttps://doi.org/10.1111/cgf.13768
dc.identifier.urihttps://diglib.eg.org:443/handle/10.1111/cgf13768
dc.description.abstractToday, Monte Carlo light transport algorithms are used in many applications to render realistic images. Depending on the complexity of the used methods, several light effects can or cannot be found by the sampling process. Especially, specular and smooth glossy surfaces often lead to high noise and missing light effects. Path space regularization provides a solution, improving any sampling algorithm, by modifying the material evaluation code. Previously, Kaplanyan and Dachsbacher [KD13] introduced the concept for pure specular interactions. We extend this idea to the commonly used microfacet models by manipulating the roughness parameter prior to the evaluation. We also show that this kind of regularization requires a change in the MIS weight computation and provide the solution. Finally, we propose two heuristics to adaptively reduce the introduced bias. Using our method, many complex light effects are reproduced and the fidelity of smooth objects is increased. Additionally, if a path was sampleable before, the variance is partially reduced.en_US
dc.publisherThe Eurographics Association and John Wiley & Sons Ltd.en_US
dc.subjectComputing methodologies
dc.subjectRay tracing
dc.subjectMathematics of computing
dc.subjectSequential Monte Carlo methods
dc.titleMicrofacet Model Regularization for Robust Light Transporten_US
dc.description.seriesinformationComputer Graphics Forum
dc.description.sectionheadersMaterials and Reflectance
dc.description.volume38
dc.description.number4
dc.identifier.doi10.1111/cgf.13768
dc.identifier.pages39-47


Files in this item

Thumbnail
Thumbnail

This item appears in the following Collection(s)

  • 38-Issue 4
    Rendering 2019 - Symposium Proceedings

Show simple item record